Fix unit tests

This commit bring tests to life!

New issue
Summary: test_dep_states test fails
When first device is idle, the second one states  "RF Transmission Error" instead of simply not found any available device.
Full cutter log here:

debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart Timeout!
debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart RX: 00  00  ff  03  fd
debug   libnfc.bus.uart RX: d5  57
debug   libnfc.bus.uart RX: 01
debug   libnfc.bus.uart RX: d3  00
debug   libnfc.chip.pn53x       Chip error: "Timeout" (01), returned error: "RF Transmission Error" (-20))
F
===============================================================================
Failure: test_dep_states
Problem with nfc_idle
<0 == res>
expected: <0>
  actual: <-20>

diff:
? -20

./test_device_modes_as_dep.c:171: initiator_thread(): cut_assert_equal_int(0, res, cut_test_context_set_current_result_user_message( cut_test_context_current_peek(), cut_test_context_take_printf(cut_test_context_current_peek(), "Problem with nfc_idle")))
===============================================================================
This commit is contained in:
Romuald Conty 2013-01-18 18:28:45 +01:00
parent 443f70dd65
commit 2d53208082
8 changed files with 87 additions and 76 deletions

View file

@ -1,3 +1,9 @@
TBD - 1.7.0-rc2 (release candidate)
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Fixes:
- Fix tests
Dec 09, 2012 - 1.7.0-rc1 (release candidate)
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