Fix unit tests

This commit bring tests to life!

New issue
Summary: test_dep_states test fails
When first device is idle, the second one states  "RF Transmission Error" instead of simply not found any available device.
Full cutter log here:

debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart Timeout!
debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart RX: 00  00  ff  03  fd
debug   libnfc.bus.uart RX: d5  57
debug   libnfc.bus.uart RX: 01
debug   libnfc.bus.uart RX: d3  00
debug   libnfc.chip.pn53x       Chip error: "Timeout" (01), returned error: "RF Transmission Error" (-20))
F
===============================================================================
Failure: test_dep_states
Problem with nfc_idle
<0 == res>
expected: <0>
  actual: <-20>

diff:
? -20

./test_device_modes_as_dep.c:171: initiator_thread(): cut_assert_equal_int(0, res, cut_test_context_set_current_result_user_message( cut_test_context_current_peek(), cut_test_context_take_printf(cut_test_context_current_peek(), "Problem with nfc_idle")))
===============================================================================
This commit is contained in:
Romuald Conty 2013-01-18 18:28:45 +01:00
parent 443f70dd65
commit 2d53208082
8 changed files with 87 additions and 76 deletions

View file

@ -5,6 +5,8 @@
#define MAX_DEVICE_COUNT 1
#define MAX_TARGET_COUNT 1
void test_register_endianness(void);
#include "chips/pn53x.h"
void
@ -13,15 +15,16 @@ test_register_endianness(void)
nfc_connstring connstrings[MAX_DEVICE_COUNT];
int res = 0;
nfc_init(NULL);
nfc_context *context;
nfc_init(&context);
size_t device_count = nfc_list_devices(NULL, connstrings, MAX_DEVICE_COUNT);
size_t device_count = nfc_list_devices(context, connstrings, MAX_DEVICE_COUNT);
if (!device_count)
cut_omit("No NFC device found");
nfc_device *device;
device = nfc_open(NULL, connstrings[0]);
device = nfc_open(context, connstrings[0]);
cut_assert_not_null(device, cut_message("nfc_open"));
uint8_t value;
@ -32,8 +35,8 @@ test_register_endianness(void)
/* Read invalid SFR register */
res = pn53x_read_register(device, 0xFFF0, &value);
cut_assert_equal_int(0, res, cut_message("read register 0xFFF0"));
cut_assert_equal_int(-1, res, cut_message("read register 0xFFF0"));
nfc_close(device);
nfc_exit(NULL);
nfc_exit(context);
}