2d53208082
This commit bring tests to life! New issue Summary: test_dep_states test fails When first device is idle, the second one states "RF Transmission Error" instead of simply not found any available device. Full cutter log here: debug libnfc.chip.pn53x InJumpForDEP debug libnfc.chip.pn53x Timeout values: 300 debug libnfc.bus.uart TX: 00 00 ff 05 fb d4 56 00 00 00 d6 00 debug libnfc.bus.uart RX: 00 00 ff 00 ff 00 debug libnfc.chip.pn53x PN53x ACKed debug libnfc.bus.uart Timeout! debug libnfc.chip.pn53x InJumpForDEP debug libnfc.chip.pn53x Timeout values: 300 debug libnfc.bus.uart TX: 00 00 ff 05 fb d4 56 00 00 00 d6 00 debug libnfc.bus.uart RX: 00 00 ff 00 ff 00 debug libnfc.chip.pn53x PN53x ACKed debug libnfc.bus.uart RX: 00 00 ff 03 fd debug libnfc.bus.uart RX: d5 57 debug libnfc.bus.uart RX: 01 debug libnfc.bus.uart RX: d3 00 debug libnfc.chip.pn53x Chip error: "Timeout" (01), returned error: "RF Transmission Error" (-20)) F =============================================================================== Failure: test_dep_states Problem with nfc_idle <0 == res> expected: <0> actual: <-20> diff: ? -20 ./test_device_modes_as_dep.c:171: initiator_thread(): cut_assert_equal_int(0, res, cut_test_context_set_current_result_user_message( cut_test_context_current_peek(), cut_test_context_take_printf(cut_test_context_current_peek(), "Problem with nfc_idle"))) =============================================================================== |
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.. | ||
Makefile.am | ||
run-test.sh | ||
test_access_storm.c | ||
test_dep_active.c | ||
test_dep_passive.c | ||
test_device_modes_as_dep.c | ||
test_register_access.c | ||
test_register_endianness.c |