libnfc/test
Romuald Conty 2d53208082 Fix unit tests
This commit bring tests to life!

New issue
Summary: test_dep_states test fails
When first device is idle, the second one states  "RF Transmission Error" instead of simply not found any available device.
Full cutter log here:

debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart Timeout!
debug   libnfc.chip.pn53x       InJumpForDEP
debug   libnfc.chip.pn53x       Timeout values: 300
debug   libnfc.bus.uart TX: 00  00  ff  05  fb  d4  56  00  00  00  d6  00
debug   libnfc.bus.uart RX: 00  00  ff  00  ff  00
debug   libnfc.chip.pn53x       PN53x ACKed
debug   libnfc.bus.uart RX: 00  00  ff  03  fd
debug   libnfc.bus.uart RX: d5  57
debug   libnfc.bus.uart RX: 01
debug   libnfc.bus.uart RX: d3  00
debug   libnfc.chip.pn53x       Chip error: "Timeout" (01), returned error: "RF Transmission Error" (-20))
F
===============================================================================
Failure: test_dep_states
Problem with nfc_idle
<0 == res>
expected: <0>
  actual: <-20>

diff:
? -20

./test_device_modes_as_dep.c:171: initiator_thread(): cut_assert_equal_int(0, res, cut_test_context_set_current_result_user_message( cut_test_context_current_peek(), cut_test_context_take_printf(cut_test_context_current_peek(), "Problem with nfc_idle")))
===============================================================================
2013-01-18 18:28:45 +01:00
..
Makefile.am warning: 'INCLUDES' is the old name for 'AM_CPPFLAGS' (or '*_CPPFLAGS') 2012-05-18 07:38:42 +00:00
run-test.sh Add a regression test directory. 2010-08-11 16:36:35 +00:00
test_access_storm.c Fix unit tests 2013-01-18 18:28:45 +01:00
test_dep_active.c Fix unit tests 2013-01-18 18:28:45 +01:00
test_dep_passive.c Fix unit tests 2013-01-18 18:28:45 +01:00
test_device_modes_as_dep.c Fix unit tests 2013-01-18 18:28:45 +01:00
test_register_access.c Fix unit tests 2013-01-18 18:28:45 +01:00
test_register_endianness.c Fix unit tests 2013-01-18 18:28:45 +01:00